Design for Test
(DFT)
Engineering Silicon for Manufacturability, Testability, and Production Excellence
Our DFT services empower semiconductor products to achieve superior test coverage, streamlined manufacturing test, and enhanced defect detection. We architect and implement comprehensive test structures that enable reliable silicon testing throughout the manufacturing lifecycle.
Our engineers collaborate seamlessly across RTL, DFT, verification, and physical implementation teams to ensure testability requirements are embedded early in the design cycle and integrated efficiently into the broader SoC architecture.
DFT engineering services
Our Capabilities
Testability engineered for reliable silicon.
DFT architecture and strategy development
IEEE test standard implementation
Scan architecture design
Test point insertion
Scan insertion and optimization
Test coverage analysis
Automatic Test Pattern Generation (ATPG)
DFT rule checking
Scan compression
DFT verification
Logic BIST (LBIST)
Pattern validation
Memory BIST (MBIST)
Manufacturing test support
JTAG and Boundary Scan
Testability designed for production confidence.
From architecture through manufacturing support, every test structure is shaped for coverage, reliability, and efficient silicon validation.
Testability by architecture
We embed DFT intent early, aligning scan, BIST, test access, and coverage goals with the broader SoC architecture.
Coverage with production focus
Our flows combine scan optimization, ATPG, compression, and rule checking to improve defect detection and manufacturing efficiency.
Confidence through closure
Verification, pattern validation, and manufacturing collateral provide a reliable path from test insertion to production readiness.
DFT architecture specification
MBIST/LBIST implementation
Scan-inserted netlist
DFT verification results
ATPG patterns
Manufacturing test collateral
Test coverage reports